An electron microscopy study of exsolved phases in natural black Australian sapphire = Etude par microscopie électronique des phases d'exsolution dans du saphir noir naturel australienMOON, A. R; PHILLIPS, M. R.Micron and microscopica acta. 1984, Vol 15, Num 3, pp 143-146, issn 0739-6260Article

Growth of epitaxial Bi-films on vicinal Si(111)LÜKERMANN, D; BANYOUDEH, S; BRAND, C et al.Surface science. 2014, Vol 621, pp 82-87, issn 0039-6028, 6 p.Article

Textures in natural pyrolusite, β-MnO₂, examined by 1 MV HRTEM = Textures de pyrolusite naturelle, β-MnO₂ étudiées par microscopie électronique à transmission haute résolution 1MVYAMADA, N; OHMASA, M; HORIUCHI, S et al.Acta crystallographica. Section B, Structural science. 1986, Vol 42, Num 1, pp 58-61, issn 0108-7681Article

Das Prinzip der Kristallstruktur von Gyrolith Ca₁₃[Si₈O₂₀]₃ (OH)₂•∼22H₂O = Principe de la structure cristalline de la gyrolithe Ca₁₃ (Si₈O₂₀)₃ (OH)₂•~22H₂OEBERHARD, E; RAHMAN, S. H.Zeitschrift für Kristallographie. 1982, Vol 159, Num 1-4, pp 34-36, issn 0044-2968Article

Composite precipitates in a commercial Al-Li-Cu-Mg-Zr alloyTERRONES, Luis Augusto H; NEVES MONTEIRO, Sergio.Materials characterization. 2007, Vol 58, Num 2, pp 156-161, issn 1044-5803, 6 p.Article

Conductance of Pb on modified Si(3 3 5) vicinal surfaceKORCZAK, Z; KWAPINSKI, T; MAZUREK, P et al.Surface science. 2010, Vol 604, Num 1, pp 54-58, issn 0039-6028, 5 p.Article

Structural analysis of the electron diffraction patterns of corundum ceramic material (α-Al₂O₃) = Analyse de la structure des réseaux de diffraction électronique du corindon (α-Al₂O₃), matériau céramiqueABD-RABO, M; TOMA, S. A; IBRAHIM, M et al.Sprechsaal (1976). 1984, Vol 117, Num 12, pp 1134-1136, issn 0341-0676Article

A semiautomated electron backscatter diffraction technique for extracting reliable twin statisticsHENRIE, B. L; MASON, T. A; HANSEN, B. L et al.Metallurgical and materials transactions. A, Physical metallurgy and materials science. 2004, Vol 35, Num 12, pp 3745-3751, issn 1073-5623, 7 p.Article

Nanosecond time resolved electron diffraction studies of the α→β in pure Ti thin films using the dynamic transmission electron microscope (DTEM)LAGRANGE, Thomas; CAMPBELL, Geoffrey H; COLVIN, Jeffrey D et al.Journal of materials science. 2006, Vol 41, Num 14, pp 4440-4444, issn 0022-2461, 5 p.Conference Paper

Quantitative electron diffraction : new features in the program system ELDXIAODONG ZOU; SUKHAREV, Y; HOVMÖLLER, S et al.Ultramicroscopy. 1993, Vol 52, Num 3-4, pp 436-444, issn 0304-3991Conference Paper

EBSD-Gefügeuntersuchungen an Aluminiummatrix-Verbundwerkstoffen = EBSD-Microstructural Investigations on Aluminium Matrix Composite MaterialsHEIMANN, Sebastian; KNYAZEVA, Marina; POHL, Michael et al.Praktische Metallographie. 2010, Vol 47, Num 11, pp 640-653, issn 0032-678X, 14 p.Article

Metallographic Specimen Preparation for Electron Backscattered Diffraction Part IVANDER VOORT, George F.Praktische Metallographie. 2011, Vol 48, Num 9, pp 454-473, issn 0032-678X, 20 p.Article

Implications of EBSD-based Grain Size Measurement on Structure-Property Correlations = Auswirkungen der Korngrössenmessung mit der EBSD auf die Wechselbeziehungen zwischen Struktur und EigenschaftenKRAL, Milo V; DRABBLE, Daniel J. F; GARDINER, Benjamin R et al.Praktische Metallographie. 2009, Vol 46, Num 9, pp 469-482, issn 0032-678X, 14 p.Article

New electron diffraction techniques using electronic hollow-cone illuminationKONDO, Y; ITO, T; HARADA, Y et al.Japanese journal of applied physics. 1984, Vol 23, Num 3, pp L178-L180, issn 0021-4922, 2Article

Radiation tolerance of M_n+1AX_n, phases, Ti₃AlC₂ and Ti₃SiC₂WHITTLE, K. R; BLACKFORD, M. G; AUGHTERSON, R. D et al.Acta materialia. 2010, Vol 58, Num 13, pp 4362-4368, issn 1359-6454, 7 p.Article

Reconstructions 3 x 3 and √3 x √3 on SiC(0 0 0 1) studied using RHEEDYAKOVLEV, Nikolai; XIE XIANNING; LOH KIAN PING et al.Surface science. 2009, Vol 603, Num 15, pp 2263-2270, issn 0039-6028, 8 p.Article

Electrical conductance at initial stage in epitaxial growth of Pb, Ag, Au and In on modified Si(111) surfaceKORCZAK, Z; KWAPINSKI, T.Surface science. 2007, Vol 601, Num 16, pp 3324-3334, issn 0039-6028, 11 p.Article

Cristallochimie de l'owyheeite: nouvelles données = Crystal chemistry of owyheeite: new dataMOËLO, Y; MOZGOVA, N; PICOT, P et al.TMPM. Tschermaks mineralogische und petrographische Mitteilungen. 1984, Vol 32, Num 4, pp 271-284, issn 0041-3763Article

Study on the Crystallization of Magnesium Oxide Samples Prepared at Different Temperatures = Etude de la cristallisation d'échantillons d'oxyde de magnésium préparés à différentes températuresABOU-SAIF, E. A; EL-DIB, A. R.Sprechsaal (1976). 1982, Vol 115, Num 11, pp 1024-1026, issn 0341-0676Article

Influence of porosity and methyl doping inside silica network: An electron diffraction and DFTB analysisSINGH, Pradeep K; KNAUP, Jan M; ZIMMERMANN, Sven et al.Microporous and mesoporous materials. 2014, Vol 200, pp 145-150, issn 1387-1811, 6 p.Article

Nanocluster interfaces and epitaxy: Ag on Si surfacesJIAN MIN ZUO; BOQUAN LI.Zeitschrift für Metallkunde. 2005, Vol 96, Num 5, pp 438-442, issn 0044-3093, 5 p.Conference Paper

Investigation of superstructures in mullite by high resolution electron microscopy and electron diffraction = Etudes des superstructures de la mullite en microscopie électronique à haute résolution et par diffraction électroniqueYLAE-JAEAESKI, J; NISSEN, H.-U.Physics and chemistry of minerals. 1983, Vol 10, Num 2, pp 47-54, issn 0342-1791Article

Ultrathin films of co-sputtered CrZr_x alloys on polymeric substratesEVANS, Drew; ZUBER, Kamil; MURPHY, Peter et al.Surface & coatings technology. 2012, Vol 206, Num 18, pp 3733-3738, issn 0257-8972, 6 p.Article

A new phase in stoichiometric Cu₆Sn₅WU, Y. Q; BARRY, J. C; YAMAMOTO, T et al.Acta materialia. 2012, Vol 60, Num 19, pp 6581-6591, issn 1359-6454, 11 p.Article

A contribution to the Al-Ni-Cr phase diagramGRUSHKO, B; KOWALSKI, W; PAVLYUCHKOV, D et al.Journal of alloys and compounds. 2008, Vol 460, Num 1-2, pp 299-304, issn 0925-8388, 6 p.Article